Rapid In-Line Detection of Macro Defects in Semiconductor Manufacturing

The manufacturing of Integrated Circuits (ICs) on semiconductor wafers involves hundreds of complex and expensive process steps. Defects can occur during any of several steps such as etch, resist removal, particle contamination, incomplete process, process variations,...

Robust Control of Quantum Gates via Sequential Convex Programming

Resource tradeoffs can often be established by solving an appropriate robust optimization problem for a variety of scenarios involving constraints on optimization variables and uncertainties. Using an approach based on sequential convex programming, we demonstrate...
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