Oct 1, 2014
The manufacturing of Integrated Circuits (ICs) on semiconductor wafers involves hundreds of complex and expensive process steps. Defects can occur during any of several steps such as etch, resist removal, particle contamination, incomplete process, process variations,...
Mar 9, 2014
This study investigated a number of different damage detection algorithms for structural health monitoring of a typical suspension bridge. The Alfred Zampa Memorial Bridge, a part of the Interstate 80 in California, was selected for this study. The focus was to...
Oct 3, 2013
Detecting the health and proper operation of equipment during manufacturing is an important part of maintaining high yields. This paper describes a model-based approach to detecting changes in equipment during manufacturing. Physics-based mathematical models of the...
Mar 13, 2013
This article presents the implementation of a calibration procedure for a finite element (FE) model of a state highway bridge using sensory data measured on the bridge. The objective is to modify the high-fidelity FE model of the bridge so that its dynamic behaviour...
Dec 13, 2012
Multivariable Nyquist eigenloci provide a much richer family of curves as compared to the SISO case. The eigenloci may be computed symbolically in many simple cases. Inspection of the generalized Nyquist eigenloci plot allows the determination of the exact values of...
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